Novel hexagonal rods and characterization of Bi 0.4Sb 1.6Se 3xTe 3(1 - X) using solid-state microwave synthesis

Materials Letters

Volumn 81, Issue , 2012, Pages 31-33

  Kadhim, A ^a   Hmood, A ^a   Hassan, H Abu ^a  

^a SCHOOL OF PHYSICS   (Malaysia)

Author keywords

Crystal structure; Defects; Electrical properties; X ray techniques

Indexed keywords

ELECTRICAL CONDUCTIVITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MAXIMUM POWER FACTOR; MICROWAVE SYNTHESIS; ORTHORHOMBIC PHASE; RHOMBOHEDRAL PHASE; TRANSMISSION ELECTRON MICROSCOPY IMAGES; X-RAY TECHNIQUES;

CRYSTAL STRUCTURE; DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; ELECTRIC PROPERTIES; FIELD EMISSION MICROSCOPES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

X RAY POWDER DIFFRACTION;

EID: 84862161249     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.04.144     Document Type: Article

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