Modeling quantitative phase image formation under tilted illuminations

Optics Letters

Volumn 37, Issue 10, 2012, Pages 1718-1720

  Bon, Pierre ^a,b   Wattellier, Benoit ^b   Monneret, Serge ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b PHASICS SA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL MEASUREMENTS; FINITE-DIFFERENCE TIME-DOMAIN (FDTD) METHODS; LATERAL SHEARING INTERFEROMETER; PLANE WAVE; QUANTITATIVE PHASE MICROSCOPIES;

FINITE DIFFERENCE TIME DOMAIN METHOD;

COMPUTER SIMULATION;

EID: 84862109108     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.001718     Document Type: Article

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