Comparison of periodic and random structures for scattering in thinfilm microcrystalline silicon solar cells

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8438, Issue , 2012, Pages

  Peters, M ^a,b   Forberich, K ^a   Battaglia, C ^c   Aberle, A G ^a   Blasi B ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^c EPFL   (Switzerland)

Author keywords

Diffraction; Scattering; Thin film microcrystalline silicon solar cells

Indexed keywords

EXTERNAL QUANTUM EFFICIENCY; HIGH CURRENTS; LIGHT-TRAPPING; RANDOM STRUCTURES; RANDOM TEXTURES; RIGOROUS COUPLED WAVE ANALYSIS; SCALAR SCATTERING; SPECTRAL RANGE; THIN-FILM SILICON SOLAR CELLS; ZNO LAYERS;

ATOMIC FORCE MICROSCOPY; DIFFRACTION; SCATTERING; SILICON SOLAR CELLS; SOLAR CONCENTRATORS; ZINC OXIDE;

PERIODIC STRUCTURES;

EID: 84861947651     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.921774     Document Type: Conference Paper

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