Selective plasmonic gas sensing: H 2, NO 2, and CO spectral discrimination by a single Au-CeO 2 nanocomposite film

Analytical Chemistry

Volumn 84, Issue 11, 2012, Pages 5025-5034

  Joy, Nicholas A ^a   Nandasiri, Manjula I ^b,c   Rogers, Phillip H ^d   Jiang, Weilin ^e   Varga, Tamas ^c   Kuchibhatla, Satyanarayana V N T ^c,f   Thevuthasan, Suntharampillai ^c   Carpenter, Michael A ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b WESTERN MICHIGAN UNIVERSITY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d Cortana Corporation ^*  (United States)

^e PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^f BATTELLE MEMORIAL INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION PEAKS; ANALYTES; AS-GROWN FILMS; AU NANOCLUSTERS; AU NANOPARTICLE; CHARGE EXCHANGES; ELEVATED TEMPERATURE; ENVIRONMENTAL CONDITIONS; EXPOSURE PERIOD; GAS CONCENTRATION; GAS EXPOSURE; GAS SENSING; HIGH TEMPERATURE; HIGH-TEMPERATURE ANNEALING; LINEAR DISCRIMINANT ANALYSIS; LOCALIZED SURFACE PLASMON RESONANCE; MULTI VARIATE ANALYSIS; OPTICAL SENSING; PEAK POSITION; PLASMONIC GAS SENSING; PLASMONIC SENSING; RUTHERFORD BACKSCATTERING SPECTROMETRY; SENSING ELEMENTS;

CHARGE TRANSFER; GAS PERMEABLE MEMBRANES; GOLD DEPOSITS; MOLECULAR BEAM EPITAXY; NANOCOMPOSITE FILMS; NITROGEN OXIDES; OXYGEN; PLASMAS; PRINCIPAL COMPONENT ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEPARATION; SURFACE PLASMON RESONANCE; THIN FILMS; X RAY DIFFRACTION;

GOLD;

EID: 84861914374     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac3006846     Document Type: Article

References (40)

1. Rogers, P. H.; Sirinakis, G.; Carpenter, M. A. J. Phys. Chem. C 2008, 112, 6749-6757
2. Rogers, P. H.; Sirinakis, G.; Carpenter, M. A. J. Phys. Chem. C 2008, 112, 8784-8790
3. Sirinakis, G.; Siddique, R.; Manning, I.; Rogers, P. H.; Carpenter, M. A. J. Phys. Chem. B 2006, 110, 13508-13511
4. Ando, M.; Kobayashi, T.; Iijima, S.; Haruta, M. Sens. Actuators, B 2003, 96, 589-595
5. Della Gaspera, E.; Guglielmi, M.; Perotto, G.; Agnoli, S.; Granozzi, G.; Post, M. L.; Martucci, A. Sens. Actuators, B 2012, 161, 675-683
6. Gaspera, E. D.; Antonello, A.; Guglielmi, M.; Post, M. L.; Bello, V.; Mattei, G.; Romanato, F.; Martucci, A. J. Mater. Chem. 2011, 21, 4293-4300
7. Buso, D.; Guglielmi, M.; Martucci, A.; Mattei, G.; Mazzoldi, P.; Sada, C.; Post, M. L. Cryst. Growth Des. 2008, 8, 744-749
8. Larsson, E. M.; Langhammer, C.; Zorić, I.; Kasemo, B. Science 2009, 326, 1091-1094
9. Buso, D.; Busato, G.; Guglielmi, M.; Martucci, A.; Bello, V.; Mattei, G.; Mazzoldi, P.; Post, M. L. Nanotechnology 2007, 18, 475505
10. Gaspera, E. D.; Guglielmi, M.; Agnoli, S.; Granozzi, G.; Post, M. L.; Bello, V.; Mattei, G.; Martucci, A. Chem. Mater. 2010, 22, 3407-3417
11. Potyrailo, R. A.; Ding, Z.; Butts, M. D.; Genovese, S. E.; Deng, T. IEEE Sens. J. 2008, 8, 815-822
12. Dini, F.; Martinelli, E.; Paolesse, R.; Filippini, D.; D'Amico, A.; Lundström, I.; Di Natale, C. Sens. Actuators, B 2011, 154, 220-225
13. Tomchenko, A. A.; Harmer, G. P.; Marquis, B. T.; Allen, J. W. Sens. Actuators, B 2003, 93, 126-134
14. Srivastava, J.; Pandey, P.; Jha, S. K.; Mishra, V.; Dwivedi, R. Sens. Transducers J. 2011, 125, 42-53
15. Potyrailo, R. A.; Leach, A. M.; Surman, C. M. ACS Comb. Sci. 2012, 14, 170-178
16. Sysoev, V. V.; Goschnick, J.; Schneider, T.; Strelcov, E.; Kolmakov, A. Nano Lett. 2007, 7, 3182-3188
17. Musatov, V. Y.; Sysoev, V. V.; Sommer, M.; Kiselev, I. Sens. Actuators, B 2010, 144, 99-103
18. Hierlemann, A.; Gutierrez-Osuna, R. Chem. Rev. (Washington, DC, U. S.) 2008, 108, 563-613
19. Trovarelli, A. Catal. Rev.: Sci. Eng. 1996, 38, 439-520
20. Fu, Q.; Kudriavtseva, S.; Saltsburg, H.; Flytzani-Stephanopoulos, M. Chem. Eng. J. (Amsterdam, Neth.) 2003, 93, 41-53
21. Yao, H. C.; Yao, Y. F. Y. J. Catal. 1984, 86, 254-265
22. Nandasiri, M. I.; Nachimuthu, P.; Varga, T.; Shutthanandan, V.; Jiang, W.; Kuchibhatla, S. V. N. T.; Thevuthasan, S.; Seal, S.; Kayani, A. J. Appl. Phys. 2011, 109 (1) 013525-7
23. Thevuthasan, S.; Peden, C. H. F.; Engelhard, M. H.; Baer, D. R.; Herman, G. S.; Jiang, W.; Liang, Y.; Weber, W. J. Nucl. Instrum. Methods Phys. Res., Sect. A 1999, 420 (1-2) 81-89
24. Mayer, M. SIMNRA User's Guide, Report IPP 9/113; Max-Planck-Institut für Plasmaphysik: Garching, Germany, 1997.
25. Lassi, U. Deactivation Correlations of Pd/Rh Three-Way Catalysts Designed for Euro IV Emission Limits; Oulu University Press: Oulu, Finland, 2003.
26. Angove, D. E.; Cant, N. W.; French, D. H.; Kinealy, K. Appl. Catal., A 2000, 194-195, 27-34
27. Costa-Nunes, O.; Ferrizz, R. M.; Gorte, R. J.; Vohs, J. M. Surf. Sci. 2005, 592, 8-17
28. Kreibig, U.; Vollmer, M. Optical Properties of Metal Clusters; Springer: Berlin, Germany, 1995.
29. Fierro, J. L. G.; Soria, J.; Sanz, J.; Rojo, J. M. J. Solid State Chem. 1987, 66, 154-162
30. Bernal, S.; Calvino, J. J.; Cifredo, G. A.; Gatica, J. M.; Omil, J. A. P.; Pintado, J. M. J. Chem. Soc., Faraday Trans. 1993, 89, 3499
31. Sohlberg, K.; Pantelides, S. T.; Pennycook, S. J. J. Am. Chem. Soc. 2001, 123, 6609-6611
32. Laachir, A.; Perrichon, V.; Badri, A.; Lamotte, J.; Catherine, E.; Lavalley, J. C.; El Fallah, J.; Hilaire, L.; Le Normand, F.; Quéméré, E.; Sauvion, G. N.; Touret, O. J. Chem. Soc., Faraday Trans. 1991, 87, 1601
33. Mamontov, E.; Egami, T.; Brezny, R.; Koranne, M.; Tyagi, S. J. Phys. Chem. B 2000, 104, 11110-11116
34. Berner, U.; Schierbaum, K.; Jones, G.; Wincott, P.; Haq, S.; Thornton, G. Surf. Sci. 2000, 467, 201-213
35. Choi, K.-H.; Coh, B.-Y.; Lee, H.-I. Catal. Today 1998, 44, 205-213
36. Dooly, G.; Fitzpatrick, C.; Lewis, E. Energy 2008, 33, 657-666
37. Jackson, J. E. A User's Guide to Principal Components; John Wiley & Sons: Hoboken, NJ, 2003.
38. Jolliffe, I. T. Principal Component Analysis; Springer: New York, 2002.
39. Haruta, M. Catal. Today 1997, 36, 153-166
40. Rogers, P. H.; Semancik, S. Sens. Actuators, B 2012, 163, 8-19