Collision cross sectional areas from analysis of fourier transform ion cyclotron resonance line width: A new method for characterizing molecular structure

Analytical Chemistry

Volumn 84, Issue 11, 2012, Pages 4851-4857

  Yang, Fan ^a   Voelkel, Jacob E ^a   Dearden, David V ^a  

^a N243 Eyring Science Center   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT PRESSURES; CROSS SECTION; CROSS SECTIONAL AREA; EXCITATION EVENTS; FOURIER TRANSFORM ION CYCLOTRON RESONANCE; GAS PRESSURES; ION-MOBILITY MEASUREMENTS; KEY FEATURE; MOLECULAR COLLISIONS; STRUCTURAL POSSIBILITIES;

DAMPING; ELECTRON CYCLOTRON RESONANCE; MOLECULAR STRUCTURE; XENON;

UNCERTAINTY ANALYSIS;

EID: 84861904125     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac300379a     Document Type: Article

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