Deformation-induced thermally activated grain growth in nanocrystalline nickel

Scripta Materialia

Volumn 67, Issue 2, 2012, Pages 133-136

  Prasad, M J N V ^a,b   Chokshi, A H ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b Brown University   (United States)

Author keywords

Focused ion beam; Grain growth; Indentation; Nanocrystalline nickel

Indexed keywords

INDENTATION EXPERIMENT; LOW TEMPERATURES; NANO-CRYSTALLINE NICKEL; NANOMETALS; STRESS-INDUCED; THERMALLY ACTIVATED;

FOCUSED ION BEAMS; INDENTATION; MATERIALS; MATERIALS PROPERTIES;

GRAIN GROWTH;

EID: 84861899516     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2012.03.041     Document Type: Article

References (19)

1. M. Ames, J. Markmann, R. Karos, A. Michels, A. Tschope, and R. Birringer Acta Mater. 56 2008 4255
2. V.Y. Gertsman, and R. Birringer Scripta Metall. Mater. 30 1994 577
3. M. Thuvander, M. Abraham, A. Cerezo, and G.D.W. Smith Mater. Sci. Technol. 17 2001 961
4. K. Zhang, J.R. Weertman, and J.A. Eastman Appl. Phys. Lett. 87 2005 061921
5. N.P. Gurao, and S. Suwas Appl. Phys. Lett. 94 2009 0191902
6. A.H. Chokshi Scripta Mater. 44 2001 2611
7. D.S. Wilkinson, and C.H. Caceres Acta Mater. 32 1984 1335
8. F.A. Mohamed, and M. Chauhan Met. Mater. Trans. 37A 2006 3555
9. T.G. Langdon Acta Metall. Mater. 42 1994 2437
10. W.D. Nix, and H. Gao J. Mech. Phys. Solids 46 1998 411
11. X.J. Ren, R.M. Hooper, C. Griffiths, and J.L. Henshall J. Mater. Sci. Lett. 22 2003 1105
12. I. Manika, and J. Maniks Acta Mater. 54 2006 2049
13. R.A. Mirshams, and P. Parakala Mater. Sci. Eng. A 372 2004 252
14. R.A. Mirshams, and R.M. Pothapragada Acta Mater. 54 2006 1123
15. M.J.N.V. Prasad, S. Suwas, and A.H. Chokshi Mater. Sci. Eng. A 503 2009 86
16. Z. Shan, E.A. Stach, J.M.K. Wiezorek, J.A. Knapp, D.M. Follstaedt, and S.X. Mao Science 305 2004 654
17. S. Brandstetter, K. Zhang, E. Escuadro, J.R. Weertman, and H. Van Swygenhoven Scripta Mater. 58 2008 61
18. S. Rubanov, and P.R. Munroe J. Microscopy 214 2004 213
19. H. Bei, S. Shim, M.K. Miller, G.M. Pharr, and E.P. George Appl. Phys. Lett. 91 2007 111915