Structural and optical characterization of CdS: Fe thin films prepared by flash evaporation method

Surface Review and Letters

Volumn 19, Issue 2, 2012, Pages

  Dizaji, H R ^a   Ghasemian, M ^b   Ehsani, M H ^a  

^a SEMNAN UNIVERSITY   (Iran)

^b ISLAMIC AZAD UNIVERSITY   (Iran)

Author keywords

flash evaporation; semiconductor; Thin film

Indexed keywords

CDS; CDS FILMS; ENERGY RANGES; EXCITATION PEAKS; FE CONTENT; FE-DOPED; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FLASH EVAPORATION; FLASH EVAPORATION TECHNIQUE; GLASS SUBSTRATES; HEXAGONAL STRUCTURES; IN-VACUUM; IRON CONCENTRATIONS; OPTICAL CHARACTERIZATION; PEAK ENERGY; PHOTOLUMINESCENCE SPECTRUM; PREFERRED ORIENTATIONS; SURFACE UNIFORMITY; THIN LAYERS; WEIGHT PERCENT;

CADMIUM COMPOUNDS; CADMIUM SULFIDE; ENERGY GAP; FIELD EMISSION MICROSCOPES; PHASE TRANSITIONS; SEMICONDUCTOR MATERIALS; SUBSTRATES; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION ANALYSIS;

FILM PREPARATION;

EID: 84861872178     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X12500126     Document Type: Article

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