Advances and applications of inherently conductive polymer technologies based on poly(3,4-ethylenedioxythiophene)

AIMCAL Fall Technical Conference 2005 and 19th International Vacuum Web Coating Conference 2005

Volumn , Issue , 2005, Pages 417-446

  Simpson, Jill ^a   Kirchmeyer, Stephan ^b   Reuter, Knud ^b  

^a HC Starck Inc   (United States)

^b BAYER AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COATING PROPERTIES; FLEXIBLE SUBSTRATE; INHERENTLY CONDUCTING POLYMERS; INHERENTLY CONDUCTIVE POLYMERS; POLY-3 ,4-ETHYLENEDIOXYTHIOPHENE; ROLL TO ROLL; TRANSPARENT CONDUCTIVE;

CONDUCTING POLYMERS; ELECTROLUMINESCENCE; ELECTROSTATIC DISCHARGE; INORGANIC COATINGS; LUMINESCENT DEVICES; OPTOELECTRONIC DEVICES; ROLLS (MACHINE COMPONENTS);

ELECTROSTATIC DEVICES;

EID: 84861822627     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (48)

1. (a) C. K. Chiang, C. R. Fincher, Y. W. Park, A. J. Heeger, H. Shirakawa, E. J. Louis, S. C. Gau and A. G. MacDiarmid, Phys. Rev. Lett. 1977, 39(17), 1098
2. (b) H. Shirakawa, E. J. Louis, A. G. MacDiarmid, C. K. Chiang and A. J. Heeger, J. Chem. Soc. Chem. Commun. 1977(16), 578
3. (c) T. Ito, H. Shirakawa and S. Ikeda, J. Polym. Sci. Polym. Chem. Ed. 1974(12), 11
4. (d) H. Shirakawa, Angew. Chem. Int. Ed. 2001, 40(14), 2575.
5. (a) A. J. Heeger, Angew. Chem., Int. Ed. 2001, 40(14), 2591
6. (b) A. J. Heeger, Synth. Met. 2001 (Volume Date 2002), 125(1), 23.
7. (a) F. Jonas, G. Heywang, W. Schmidtberg, J. Heinze and M. Dietrich, EP 339 340 (Bayer AG), Prior.: 1988-04-22
8. (b) G. Heywang and F. Jonas, Adv. Mater. 1992, 4(2), 117.
9. Q. Pei, G. Zuccarello, M. Ahlskog and O. Inganäs, Polymer 1994, 35(7), 1347.
10. S. Kirchmeyer, K. Reuter, J. Mater. Chem. 2005, 15, 2077.
11. F. Jonas and W. Krafft, EP 440 957 (Bayer AG), Prior.: 1990-02-08.
12. (a) F. Jonas, L. Groenendaal and J. Pausch, unpublished results
13. (b) K. Reuter, A. Karbach, H. Ritter and N. Wrubbel, EP 1 440 974 A2 (Bayer AG), Prior.: 2003-01-21.
14. S. Ghosh and O. Inganäs, Synth. Met. 1999, 101(1-3), 413.
15. F. Jonas and G. Heywang, Electrochim. Acta 1994, 39(8/9), 1345.
16. A. G. J. Staring and D. Braun, WO 96 08047 (Philips Electronics N. V.), Prior.:1994-09-06.
17. The approximate compositions by weight of formulations use in this study are: CPP103D - 0.3% PEDT:PSS, 25.6% water, 0.1% dimethylaminoethanol, 38.8% Alberdingk-Boley binder U710, 9% N-methylpyrrolidone, 0.3% Silquest® A 187 (GE Silicones), 25.6% isopropanol, and 0.3% Dynol™ 604 (Air Products); CPP 105D - 0.6% PEDT:PSS, 42.2% water, 2.6% N-methylpyrrolidone, 0.9% Silquest® A 187 (GE Silicones), 53.3% isopropanol, and 0.3% Dynol™ 604 (Air Products).
18. (a) F. Jonas, A. Karbach, B. Muys, E. van Thillo, R. Wehrmann, A. Elschner and R. Dujardin, EP 686 662 (Bayer AG), Prior.: 1994-05-06/1995-03-03
19. (b) H. J. Snaith, H. Kenrick, M. Chiesa, R. H. Friend, Polymer 2005, 46, 2573
20. (c) S. L. Lai, M. Y. Chan, M. K. Fung, C. S. Lee, S. T. Lee, Mater. Sci. Eng. B 2003, 104, 26.
21. B. D. Martin, N. Nikolov, S. K. Pollack, A. Saprigin, R. Shashidar, F. Zhang and P. A. Heiney, Synth. Met. 2004, 142 (1-3), 187
22. (a) L. A. A. Pettersson, S. Ghosh and O. Inganäs, Org. Electronics 2002, 3(3-4), 143
23. (b) S. K. M. Jönsson, J. Birgerson, X. Crispin, G. Greczynski, W. Osikowicz, A. W. Denier van der Gon, W. R. Salaneck and M. Fahlman, Synth. Met. 2003, 139(1), 1
24. (c) J. Ouyang, C.-W. Chu, F.-C. Chen, Q. Xu, Y. Yang, Adv. Funct. Mater. 2005, 15, 203.
25. (a) J. Ouyang, Q. Xu, C.-W. Chu, Y. Yang, G. Li and J. Shinar, Polymer 2004, 45(25), 8443
26. (b) S. Timpanaro, M. Kemerink, F. J. Touwslager, M. M. De Kok and S. Schrader, Chem. Phys. Lett. 2004, 394(4-6), 339
27. (c) J. Huang, P. F. Miller, J. S. Wilson, A. J. deMello, J. C. deMello, D. D. C. Bradley, Adv. Funct. Mater. 2005, 15, 290.
28. The approximate compositions by weight of the formulations used in this study are as follows: (a) CPP 105D - see endnote 11
29. (b) CPP 135D - 0.3% PEDT:PSS, 44.9% water, 0.1% dimethylaminoethanol, 20.2% NeoRez® R986 (NeoResins), 0.2% Silquest® A 187 (GE Silicones), 30.3% isopropanol, 3.9% N-methylpyrrolidone, and 0.1% Dynol™ 604 (Air Products)
30. (c) CPP 137D - 0.3% PEDT:PSS, 44.9% water, 0.1% dimethylaminoethanol, 20.2% Gabusen® ES 210 (Nagase ChemteX), 0.2% Silquest® A 187 (GE Silicones), 30.3% isopropanol, 3.9% N-methylpyrrolidone, and 0.1% Dynol™ 604
31. (d) CPP 141D - 0.7% PEDOT:PSS, 52% water, 0.2% dimethylamino-ethanol, 31.4% NeoRez® R986 (NeoResins), 10.5% Eastek® 1200-02-30% (Eastman Chemical), 2% isopropanol, 3.1% N-methylpyrrolidone, and 0.1% DynolTM 604 (Air Products).
32. J. Huang, P. F. Miller, J. C. deMello, A. J. deMello, D. D. C. Bradley, Synth. Met. 2003, 139, 569.
33. (a) F. Jonas, W. Krafft and B. Muys, Macromol. Symp. 1995, 100, 169
34. (b) F. Jonas and J. T. Morrison, Synth. Met. 1997, 85(1-3), 1397
35. (c) F. Jonas and K. Lerch, Kunststoffe 1997, 87(10), 1401.
36. A. Thiess, Deutsche Gebrauchsmusterschrift (2001), DE 20021226 U1, Prior.: 2001-04-19.
37. (a) O. Hotta, S. Soga and N. Sonoda, JP 02129284 (Matsushita Electric Ind. Co.), Prior.: 1988-11-08
38. (b) S. Y. Yoon, C. H. Lee and H. S. Son, KR 2000 009403 (Orion Electric Co.), Prior.: 1998-07-24
39. (c) H. Tong, J. Hu, CN 1 171 617 A (Zhonghua Kinescope Co.), Prior.: 1996-07-23.
40. th Fachtagung über Verarbeitung und Anwendung von Polymeren, 1999, Chemnitz, Germany; CAN 137: 80211.
41. (a) T. Kawashima and T. Sekiya, JP 2002 241613 A2 (Sony Chemical Corp.), Prior.: 2002-08-28
42. (b) T. Kawa-shima and T. Sekiya, JP 2003 251756 A2 (Sony Chemical Corp.), Prior.: 2003-09-09.
43. Y. Morimoto, JP 2000 026817 A2 (Teijin Ltd.), Prior.: 1998-07-14.
44. F. Nittel, H. Randolph and W. Himmelmann, EP 554 588 (Agfa AG), Prior.: 1993-12-23.
45. H. Shinohara, JP 2003 246874 A2 (HS Planning Y. K.), Prior.: 2002-02-26.
46. (a) H. Andriessen, EP 1 231 251 A1 (Agfa-Gevaert), Prior.: 2002-08-14
47. (b) A. Saito, JP 2002 124391 A2 (Seiko Precision Inc.), Prior.:2000-08-08.
48. E. Enz, WO 2003 037039 A1 (Lumitec AG), Prior.: 2001-10-24.