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Volumn 111, Issue 7, 2012, Pages
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Al doped Ba hexaferrite (BaAl xFe 12-xO 19) thin films on Pt using metallo-organic decomposition
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Author keywords
[No Author keywords available]
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Indexed keywords
AL CONTENT;
AL DOPED;
AL-CONCENTRATION;
ATOMIC FORCE MICROSCOPE (AFM);
BARIUM HEXAFERRITES;
BROADBAND FERROMAGNETIC RESONANCE;
EASY AXIS;
EFFECTIVE ANISOTROPY;
FERROMAGNETIC RESONANCE LINEWIDTH;
GRAIN SIZE;
HEXAFERRITES;
METALLO-ORGANIC DECOMPOSITIONS;
MICROWAVE PROPERTY;
OUT-OF PLANE;
POLYCRYSTALLINE FILM;
PT(111);
SI WAFER;
ATOMIC FORCE MICROSCOPY;
BARIUM;
FERRITE;
FERROMAGNETIC RESONANCE;
PLATINUM;
SILICON WAFERS;
THIN FILMS;
X RAY DIFFRACTION;
ALUMINUM;
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EID: 84861761112
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3676604 Document Type: Conference Paper |
Times cited : (11)
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References (19)
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