AlN thin film transducers for high temperature non-destructive testing applications

Journal of Applied Physics

Volumn 111, Issue 7, 2012, Pages

  Hou, Ruozhou ^a   Hutson, David ^a   Kirk, Katherine J ^a   Qing Fu, Yong ^a  

^a UNIVERSITY OF THE WEST OF SCOTLAND   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALN FILMS; ALN THIN FILMS; CARBON STEEL SUBSTRATES; CRYSTALLINE STRUCTURE; ELEVATED TEMPERATURE; HIGH TEMPERATURE; HIGH TEMPERATURE PERFORMANCE; HIGH-TEMPERATURE ENVIRONMENT; NON DESTRUCTIVE TESTING; PULSE ECHOES; SUBSTRATE PROPERTIES; SURFACE OXIDATIONS;

CARBON STEEL; HIGH TEMPERATURE APPLICATIONS; NONDESTRUCTIVE EXAMINATION; SUBSTRATES; THIN FILMS; TRANSDUCERS; ULTRASONIC TRANSDUCERS;

TEMPERATURE;

EID: 84861754181     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3700345     Document Type: Conference Paper

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