SCOPUS 정보 검색 플랫폼

Volumn 111, Issue 7, 2012, Pages

Piezoelectric properties of epitaxial Pb(Zr 0.525, Ti 0.475)O 3 films on amorphous magnetic metal substrates

(12) Hu, B a Chen, Y a Yang, A a,d Gillete, S a Fitchorov, Trifon a Geiler, A a Daigle, A a Su, X D b Wang, Z c Viehland, D c Vittoria, C a Harris, V G a

a Northeastern University (United States)

b SOOCHOW UNIVERSITY (China)

c State University (United States)

d SAN JOSE RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SURFACES; CRYSTALLOGRAPHIC STRUCTURE; DEPOSITION CONDITIONS; FERROELECTRIC AND PIEZOELECTRIC PROPERTIES; HIGH PIEZOELECTRIC CONSTANT; HIGH QUALITY; MAGNETIC METALS; MAGNETOELECTRIC SENSORS; MAGNETOSTRICTIVE MATERIAL; PIEZOELECTRIC CONSTANT; PIEZOELECTRIC PROPERTY; PIEZOELECTRIC RESPONSE; PZT; PZT FILM; PZT THIN FILM;

BUFFER LAYERS; EPITAXIAL GROWTH; FERROELECTRIC FILMS; GOLD; LEAD; PIEZOELECTRICITY; PLATINUM; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; ZIRCONIUM;

AMORPHOUS FILMS;

EID: 84861751464 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3677864 Document Type: Conference Paper

Times cited : (7)

References (15)

1
- 39349110724
- 10.1063/1.2836410
- C. Nan, J. Appl. Phys. 103, 031101 (2008). 10.1063/1.2836410
- (2008) J. Appl. Phys. , vol.103 , pp. 031101
- Nan, C.¹

2
- 71049172578
- 10.1063/1.3258023
- Y. Chen, Appl. Phys. Lett. 95, 182501 (2009). 10.1063/1.3258023
- (2009) Appl. Phys. Lett. , vol.95 , pp. 182501
- Chen, Y.¹

3
- 78650167899
- 10.1007/s00339-010-5726-9
- Y. Chen, Appl. Phys. A 100, 1149 (2010). 10.1007/s00339-010-5726-9
- (2010) Appl. Phys. A , vol.100 , pp. 1149
- Chen, Y.¹

4
- 72449122657
- 10.1080/10408430701707347
- N. Izyumskaya, Crit. Rev. Solid State Mater. Sci. 32, 111 (2007). 10.1080/10408430701707347
- (2007) Crit. Rev. Solid State Mater. Sci. , vol.32 , pp. 111
- Izyumskaya, N.¹

5
- 79951815077
- 10.1063/1.3544352
- Z. Wang, J. Appl. Phys. 109, 034102 (2011). 10.1063/1.3544352
- (2011) J. Appl. Phys. , vol.109 , pp. 034102
- Wang, Z.¹

6
- 79961063161
- 10.1063/1.3617434
- Y. Chen, Appl. Phys. Lett. 99, 042505 (2011). 10.1063/1.3617434
- (2011) Appl. Phys. Lett. , vol.99 , pp. 042505
- Chen, Y.¹

7
- 33744744089
- 10.1063/1.104719
- H. Kidoh and T. Ogawa, Appl. Phys. Lett. 58, 25 (1991). 10.1063/1.104719
- (1991) Appl. Phys. Lett. , vol.58 , pp. 25
- Kidoh, H.¹ Ogawa, T.²

8
- 79961038652
- 10.1063/1.3615295
- S. S. N. Bharadwaja, Appl. Phys. Lett. 99, 042903 (2011). 10.1063/1.3615295
- (2011) Appl. Phys. Lett. , vol.99 , pp. 042903
- Bharadwaja, S.S.N.¹

9
- 84859527567
- Z. Trajanovic, Appl. Phys. Lett. 66, 12 (1995).
- (1995) Appl. Phys. Lett. , vol.66 , pp. 12
- Trajanovic, Z.¹

10
- 77955925741
- 10.1016/j.scriptamat.2010.03.041
- S. Sriram, Scr. Mater. 63, 189 (2010). 10.1016/j.scriptamat.2010.03.041
- (2010) Scr. Mater. , vol.63 , pp. 189
- Sriram, S.¹

11
- 20444461611
- 10.1016/j.jeurceramsoc.2005.03.046
- G. Le Rhun, J. Eur. Ceram. Soc. 25, 2281 (2005). 10.1016/j.jeurceramsoc. 2005.03.046
- (2005) J. Eur. Ceram. Soc. , vol.25 , pp. 2281
- Le Rhun, G.¹

12
- 67650446258
- 10.1063/1.3163057
- M. Dekkers, Appl. Phys. Lett. 95, 012902 (2009). 10.1063/1.3163057
- (2009) Appl. Phys. Lett. , vol.95 , pp. 012902
- Dekkers, M.¹

13
- 31644440093
- 10.1016/j.scriptamat.2005.12.030
- J. Yang, Scr. Mater. 54, 1281 (2006). 10.1016/j.scriptamat.2005.12.030
- (2006) Scr. Mater. , vol.54 , pp. 1281
- Yang, J.¹

14
- 77955427822
- 10.1016/j.tsf.2010.05.108
- Y. Yang, Thin Solid Films 518, 5806 (2010). 10.1016/j.tsf.2010.05.108
- (2010) Thin Solid Films , vol.518 , pp. 5806
- Yang, Y.¹

15
- 0034496859
- 10.1016/S0040-6090(00)01563-7
- H. Qin, Thin Solid Films 379, 72 (2000). 10.1016/S0040-6090(00)01563-7
- (2000) Thin Solid Films , vol.379 , pp. 72
- Qin, H.¹

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