Characterization of the electronic structure of E2′ defect in quartz by pulsed EPR spectroscopy

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 376, Issue 32, 2012, Pages 2195-2199

  Feng, Pengbo ^a   Wang, Ya ^a   Rong, Xing ^a   Su, Ji Hu ^a   Ju, Chenyong ^a   Du, Jiangfeng ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

E 2 defect in quartz; Electronic structure; EPR; Relaxation property

Indexed keywords

DEFECTS; ELECTRON SOURCES; ELECTRONIC STRUCTURE; PARAMAGNETIC RESONANCE; QUANTUM COMPUTERS; QUARTZ; TEMPERATURE DISTRIBUTION;

NUCLEAR STRUCTURE; POSSIBLE MECHANISMS; PULSED ELECTRON; QUANTUM COMPUTING; QUANTUM MEMORY; RELAXATION PROPERTY; TEMPERATURE DEPENDENCE; TRANSVERSE RELAXATION;

ELECTRON SPIN RESONANCE SPECTROSCOPY;

EID: 84861746131     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2012.05.029     Document Type: Article

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