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Thin Solid Films

Volumn 520, Issue 16, 2012, Pages 5367-5371

Effects of oxygen stoichiometry on electrochromic properties in amorphous tungsten oxide films

(7) Inamdar, Akbar I a Kim, Y S a Jang, B U a Im, Hyunsik a Jung, Woong a Kim, Dae Young a Kim, Hyungsang a

a Dongguk University (South Korea)

Author keywords

Electrochromic properties; Sputtering; Tungsten oxide

Indexed keywords

COLORATION EFFICIENCIES; COLORATION MECHANISM; ELECTROCHROMIC PROPERTIES; ELECTROCHROMICS; OVER-STOICHIOMETRIC; OXYGEN CONTENT; OXYGEN STOICHIOMETRY; PROPYLENE CARBONATE; SATURATION MODEL; TUNGSTEN OXIDE; TUNGSTEN OXIDE FILMS;

DEGRADATION; OPTIMIZATION; OXIDE FILMS; OXIDES; OXYGEN; SPUTTERING; STOICHIOMETRY; TUNGSTEN COMPOUNDS;

ELECTROCHROMIC DEVICES;

EID: 84861733252 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2012.04.026 Document Type: Article

Times cited : (33)

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