Annealing effect on the structure and electronic transport properties in La 5/8Ca 3/8MnO 3/ErMnO 3 multilayer thin films

Journal of Nanoscience and Nanotechnology

Volumn 12, Issue 2, 2012, Pages 1049-1053

  Han, Y X ^a   Zhu, C F ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Annealing Effect; Interface Effect; Multiferriocs; Two MR Peaks

Indexed keywords

ANNEALING EFFECTS; BRAGG ANGLES; COMPOSITE THIN FILMS; ELECTRONIC TRANSPORT PROPERTIES; HIGH-TEMPERATURE ANNEALING; INTERFACE EFFECT; M-I TRANSITION; MULTI-LAYER THIN FILM; MULTIFERRIOCS; OXYGEN PRESSURE; SINGLE LAYER FILMS; STRUCTURAL CHARACTERIZATION; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; TWO MR PEAKS;

ANNEALING; CALCIUM; FILM PREPARATION; MANGANESE OXIDE; MULTILAYERS; NANOCOMPOSITE FILMS; PULSED LASER DEPOSITION; SEMICONDUCTOR INSULATOR BOUNDARIES; SUBSTRATES; TRANSPORT PROPERTIES; X RAY DIFFRACTION;

LANTHANUM;

EID: 84861717396     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2012.4263     Document Type: Conference Paper

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