메뉴 건너뛰기




Volumn 85, Issue 18, 2012, Pages

Theory of temperature fluctuation statistics in superconductor-normal metal tunnel structures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84861706691     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.184521     Document Type: Article
Times cited : (8)

References (19)
  • 2
    • 0037644091 scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.14.2456
    • J. M. Rowell and D. C. Tsui, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.14.2456 14, 2456 (1976).
    • (1976) Phys. Rev. B , vol.14 , pp. 2456
    • Rowell, J.M.1    Tsui, D.C.2
  • 4
    • 36449001957 scopus 로고    scopus 로고
    • Efficient Peltier refrigeration by a pair of normal metal/insulator/ superconductor junctions
    • DOI 10.1063/1.115651, PII S0003695196020141
    • M. M. Leivo, J. P. Pekola, and D. V. Averin, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.115651 68, 1996 (1996). (Pubitemid 126688450)
    • (1996) Applied Physics Letters , vol.68 , Issue.14 , pp. 1996-1998
    • Leivo, M.M.1    Pekola, J.P.2    Averin, D.V.3
  • 5
    • 64849107367 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.102.130605
    • T. T. Heikkilä and Y. V. Nazarov, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.102.130605 102, 130605 (2009).
    • (2009) Phys. Rev. Lett. , vol.102 , pp. 130605
    • Heikkilä, T.T.1    Nazarov, Y.V.2
  • 6
    • 77952376058 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.104.196805
    • M. A. Laakso, T. T. Heikkilä, and Y. V. Nazarov, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.104.196805 104, 196805 (2010).
    • (2010) Phys. Rev. Lett. , vol.104 , pp. 196805
    • Laakso, M.A.1    Heikkilä, T.T.2    Nazarov, Y.V.3
  • 7
    • 78649754749 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.82.205316
    • M. A. Laakso, T. T. Heikkilä, and Y. V. Nazarov, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.82.205316 82, 205316 (2010).
    • (2010) Phys. Rev. B , vol.82 , pp. 205316
    • Laakso, M.A.1    Heikkilä, T.T.2    Nazarov, Y.V.3
  • 8
    • 84856946824 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.108.067002
    • M. A. Laakso, T. T. Heikkilä, and Y. V. Nazarov, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.108.067002 108, 067002 (2012).
    • (2012) Phys. Rev. Lett. , vol.108 , pp. 067002
    • Laakso, M.A.1    Heikkilä, T.T.2    Nazarov, Y.V.3
  • 9
    • 70449396939 scopus 로고    scopus 로고
    • ADPHAH 0001-8732 10.1080/00018730902850504
    • A. Kamenev and A. Levchenko, Adv. Phys. ADPHAH 0001-8732 10.1080/00018730902850504 58, 197 (2009).
    • (2009) Adv. Phys. , vol.58 , pp. 197
    • Kamenev, A.1    Levchenko, A.2
  • 10
    • 2142763047 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.69.115315
    • S. Pilgram, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.69.115315 69, 115315 (2004).
    • (2004) Phys. Rev. B , vol.69 , pp. 115315
    • Pilgram, S.1
  • 11
    • 42149136802 scopus 로고    scopus 로고
    • PRBMDO 1098-0121 10.1103/PhysRevB.77.165118
    • I. Snyman and Y. V. Nazarov, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.77.165118 77, 165118 (2008).
    • (2008) Phys. Rev. B , vol.77 , pp. 165118
    • Snyman, I.1    Nazarov, Y.V.2
  • 13
    • 0000508287 scopus 로고    scopus 로고
    • Noise in Refrigerating Tunnel Junctions and in Microbolometers
    • DOI 10.1023/A:1017589828739
    • D. V. Anghel and J. P. Pekola, J. Low Temp. Phys. JLTPAC 0022-2291 10.1023/A:1017589828739 123, 197 (2001). (Pubitemid 33640545)
    • (2001) Journal of Low Temperature Physics , vol.123 , Issue.3-4 , pp. 197-218
    • Anghel, D.V.1    Pekola, J.P.2
  • 17
    • 0004473015 scopus 로고    scopus 로고
    • PRPLCM 0370-1573 10.1016/S0370-1573(99)00123-4
    • Y. M. Blanter and M. Büttiker, Phys. Rep. PRPLCM 0370-1573 10.1016/S0370-1573(99)00123-4 336, 1 (2000).
    • (2000) Phys. Rep. , vol.336 , pp. 1
    • Blanter, Y.M.1    Büttiker, M.2
  • 18
    • 84861686898 scopus 로고    scopus 로고
    • Up to a frequency determined by the stray capacitances of the measurement circuit. This frequency is very high compared to the frequency scale of temperature fluctuations.
    • Up to a frequency determined by the stray capacitances of the measurement circuit. This frequency is very high compared to the frequency scale of temperature fluctuations.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.