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Volumn 44, Issue 6, 2012, Pages 780-783
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Study on structure of heat-treated fullerene nanowhiskers and their field electron emission characteristics
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Author keywords
electron microscopy; field electron emission; fullerene nanowhiskers; Raman spectroscopy
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Indexed keywords
FIELD ELECTRON EMISSIONS;
FIELD EMISSION MICROSCOPY;
FULLERENE NANOWHISKERS;
GRAPHITIC LAYERS;
HEXAGONAL CROSS-SECTIONS;
HIGH VACUUM;
INNER STRUCTURE;
LONG AXIS;
SCANNING ELECTRONS;
SINGLE-CRYSTALLINE;
STRAIGHT-SHAPE;
UNIFORM DIAMETER;
ELECTRON EMISSION;
ELECTRON MICROSCOPY;
FIELD EMISSION;
FIELD EMISSION MICROSCOPES;
FULLERENES;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
TRANSMISSION ELECTRON MICROSCOPY;
NANOWHISKERS;
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EID: 84861614661
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.3868 Document Type: Conference Paper |
Times cited : (5)
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References (20)
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