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Applied Physics A: Materials Science and Processing

Volumn 107, Issue 3, 2012, Pages 519-523

Curie temperatures of CoPt ultrathin continuous films

(6) Cai, Wupeng a,b Muraishi, Shinji b Shi, Ji b Nakamura, Yoshio b Liu, Wei a Yu, Ronghai c

a TSINGHUA UNIVERSITY (China)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

c BEIHANG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

AFTER HIGH TEMPERATURE; ALN; AS-DEPOSITED STATE; CONTINUOUS FILMS; CONTINUOUS LAYERS; COUPLING PARAMETERS; CRITICAL THICKNESS; IN-PLANE LATTICES; LATTICE DEFORMATION; LAYER THICKNESS; MULTILAYER STRUCTURES; ORDERING TRANSFORMATION; SPIN-SPIN INTERACTION; THERMAL-ANNEALING; THIN LAYERS; ULTRA-THIN;

ANNEALING; DEGRADATION; MULTILAYERS; THICK FILMS; ULTRATHIN FILMS;

CURIE TEMPERATURE;

EID: 84861576734 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-012-6934-2 Document Type: Article

Times cited : (3)

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