Ferroelectric relaxor properties of (1 - X)K 0.5Na 0.5NbO 3-xBa 0.5Ca 0.5TiO 3 ceramics

Current Applied Physics

Volumn 12, Issue 5, 2012, Pages 1266-1271

  Cho, C W ^a   Cha, M R ^a   Jang, J Y ^a   Lee, S H ^a   Kim, D J ^a   Park, S ^a   Bae, J S ^b   Bu, S D ^c   Lee, S ^d   Huh, J ^e  

^a Pusan National University   (South Korea)

^b Korea Basic Science Institute (KBSI)   (South Korea)

^c Chonbuk National University   (South Korea)

^d JPS Micro Tech   (South Korea)

^e Chonnam National University   (South Korea)

Author keywords

Dielectric constant; Relaxor ferroelectric; X ray diffraction

Indexed keywords

CURIE-WEISS EXPONENTS; FERROELECTRIC RELAXOR BEHAVIOR; FERROELECTRIC RELAXORS; FREQUENCY DEPENDENT; POWDER STRUCTURES; RELAXOR FERROELECTRIC; ROOM TEMPERATURE; TIO;

CALCIUM; FERROELECTRICITY; NIOBIUM OXIDE; PERMITTIVITY; SODIUM; STRUCTURAL PROPERTIES; X RAY DIFFRACTION;

FERROELECTRIC MATERIALS;

EID: 84861575031     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2012.03.006     Document Type: Article

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