Evaluating maize grain quality by continuous wavelet analysis under normal and lodging circumstances

Sensor Letters

Volumn 10, Issue 1-2, 2012, Pages 580-585

  Zhang, Jingcheng ^a,b   Gu, Xiaohe ^a   Wang, Jihua ^a   Huang, Wenjiang ^a   Dong, Yingying ^a,b   Luo, Juhua ^a   Yuan, Lin ^a,b   Li, Yufei ^c  

^a NATIONAL ENGINEERING RESEARCH CENTER FOR INFORMATION TECHNOLOGY IN AGRICULTURE   (China)

^b ZHEJIANG UNIVERSITY   (China)

^c General Planning and Supervision Division China Rural Technology Development Center   (China)

Author keywords

Continuous Wavelet Analysis; Grain Quality; Hyperspectral Measurement; Partial Least Squares Regression

Indexed keywords

CONTINUOUS WAVELET ANALYSIS; GRAIN QUALITY; GROWING PERIOD; HYPERSPECTRAL; LEAF LEVEL; MAIZE PLANTS; MULTIPLE REGRESSION MODEL; NEAR INFRARED; NON-CONTACT; PARTIAL LEAST SQUARES REGRESSION; PHYSICAL FORCE; PREDICTING MODELS; ROOT LODGING; SPECTRAL FEATURE; WAVELENGTH POSITION;

FORECASTING; REGRESSION ANALYSIS; STARCH; WAVELET DECOMPOSITION;

WAVELET ANALYSIS;

EID: 84861553218     PISSN: 1546198X     EISSN: 15461971     Source Type: Journal    
DOI: 10.1166/sl.2012.1871     Document Type: Review

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