Optical, electrochemical, and structural properties of Er-doped porous silicon

Journal of Physical Chemistry C

Volumn 116, Issue 20, 2012, Pages 11256-11260

  Mula, Guido ^a   Setzu, Susanna ^a   Manunza, Gianluca ^a   Ruffilli, Roberta ^b   Falqui, Andrea ^b  

^a UNIVERSITY OF CAGLIARI   (Italy)

^b ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL BEHAVIORS; ER-DOPED; ER-DOPING; EX SITU; IN-SITU; OPTICAL REFLECTIVITY; REFLECTIVITY SPECTRA;

POROUS SILICON; REFLECTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY;

ERBIUM;

EID: 84861517002     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp301851h     Document Type: Article

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