Evaluating liquid crystal properties for use in terahertz devices

Optics Express

Volumn 20, Issue 11, 2012, Pages 11899-11905

  Park, Hongkyu ^a   Parrott, Edward P J ^b   Fan, Fan ^a   Lim, Meehyun ^c   Han, Haewook ^c   Chigrinov, Vladimir G ^a   Pickwell Macpherson, Emma ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; LIQUID CRYSTALS;

CRYSTAL PROPERTIES; TERA HERTZ; TERAHERTZ DEVICE; TERAHERTZ RANGE; VISIBLE FREQUENCIES;

TERAHERTZ SPECTROSCOPY;

ARTICLE; CHEMISTRY; LIGHT; LIQUID CRYSTAL; MATERIALS TESTING; RADIATION SCATTERING; REFRACTOMETRY; TERAHERTZ RADIATION;

LIGHT; LIQUID CRYSTALS; MATERIALS TESTING; REFRACTOMETRY; SCATTERING, RADIATION; TERAHERTZ RADIATION;

EID: 84861514869     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.011899     Document Type: Article

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