Microstructure and composition of Sn 1-xPb xS films and whiskers grown by hot wall technique

Journal of Advanced Microscopy Research

Volumn 6, Issue 1, 2011, Pages 53-57

  Lazenka, Vera V ^a   Bente, Klaus ^a   Kaden, Ronny ^a   Ivanov, Vasiliy A ^b   Gremenok, Valeriy F ^b  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

Author keywords

Hot wall deposition; Lead tin sulphide; Nanowhiskers; Scanning electron microscopy; Transmission electron microscopy; Vapor liquid solid mechanism

Indexed keywords

COMPOSITION GRADIENT; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HOT WALL; LEAD CONCENTRATION; LEAD-TIN; ORTHORHOMBIC CRYSTAL STRUCTURES; POLYCRYSTALLINE THIN FILM; PREFERENTIAL ORIENTATION; SUBSTRATE SURFACE; SUBSTRATE TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY TEM; VACUUM DEPOSITION METHOD; VAPOR-LIQUID-SOLID MECHANISM; WHISKER GROWTH;

LIQUIDS; NANOWHISKERS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TIN; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; VAPORS; X RAY SPECTROSCOPY;

LEAD;

EID: 84861495253     PISSN: 21567573     EISSN: 21567581     Source Type: Journal    
DOI: 10.1166/jamr.2011.1049     Document Type: Article

References (17)

1. A. P. Alivisatos, Science 271, 933 (1996).
2. C. M. Lieber, Solid State Commun. 107, 607 (1998).
3. L. Manna, E. C. Scher, and A. P. Alivisatos, J. Am. Chem. Soc. 122, 12700 (2000).
4. Z. X. Deng, C. Wang, X. M. Sun, and Y. D. Li, Inorg. Chem. 41, 869 (2002).
5. Y. N. Xia, P. D. Yang, Y. G. Sun, Y. Y. Wu, B. Mayers, B. Gates, Y. D. Yin, F. Kim, and H. Q. Yan, Adv. Materials 15, 353 (2003).
6. R. S. Wagner and W. S. Ellis, Appl. Phys. Lett. 4, 89 (1964).
7. Y. Wu and P. Yang, J. Am. Chem. Soc. 123, 3165 (2001).
8. A. Yella, E. Mugnaioli, M. Panthofer, H. A. Therese, U. Kolb, and W. Tremel, Angew. Chem. Int. Ed. 48, 6426 (2009).
9. Y. Wu and P. Yang, Chem. Mater. 12, 605 (2000).
10. M. S. Gudiksen and C. M. Lieber, J. Am. Chem. Soc. 122, 8801 (2000).
11. J. Zhang, X. S. Peng, X. F. Wang, Y. W. Wang, and L. D. Zhang, Chem. Phys. Lett. 345, 372 (2001).
12. D. M. Unuchak, K. Bente, G. Kloess, W. Schmitz, V. F. Gremenok, V. A. Ivanov, and V. Ukhov, Phys. Stat. Sol. C 6, 1191 (2009).
13. K. Bente, V. V. Lazenka, D. M. Unuchak, G. Wagner, and V. F. Gremenok, Cryst. Res. Technol. 45, 643 (2010).
14. V. G. Shepelevich, P. A. Siutsova, E. Yu. Neumerzhytskaya, E. S. Gutko, and K. V. Kuckorecko, J. Alloys Comp. 403, 267 (2005).
15. M. Paic and V. Paic, J. Mater. Sci. 7, 1260 (1972).
16. A. Lopez-Otero and L. D. Haas, Thin Solid Films 23, 1 (1974).
17. K. Duh and H. Preier, Thin Solid Films 27, 247 (1975).