Patterson selectivity by modulation-enhanced diffraction

Journal of Applied Crystallography

Volumn 45, Issue 3, 2012, Pages 458-470

  Caliandro, Rocco ^a   Chernyshov, Dmitry ^b   Emerich, Hermann ^b   Milanesio, Marco ^c   Palin, Luca ^c   Urakawa, Atsushi ^d   Van Beek, Wouter ^b   Viterbo, Davide ^c  

^a CNR   (Italy)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF EASTERN PIEDMONT   (Italy)

^d INSTITUTE OF CHEMICAL RESEARCH OF CATALONIA ICIQ   (Spain)

Author keywords

modulation enhanced diffraction; Patterson deconvolution; phase sensitive detection; phasing methods; powder structure solution; single crystal structure solution

Indexed keywords

BEAM LINES; DATA SELECTION; DECONVOLUTION TECHNIQUES; DIFFRACTION SIGNALS; DYNAMIC BEHAVIOURS; EXCITATION SPECTROSCOPY; EXTERNAL PERTURBATIONS; INTERFERENCE TERMS; LINEAR RESPONSE; PERIODIC VARIATION; PHASE-SENSITIVE DETECTION; PHASING METHODS; PHYSICAL SYSTEMS; POLYCRYSTALLINE; POWDER STRUCTURES; SINGLE-CRYSTAL STRUCTURE; SITE OCCUPANCY; WELL-ESTABLISHED TECHNIQUES;

ATOMS; DATA REDUCTION; MODULATION; XENON;

DIFFRACTION;

EID: 84861494326     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812011569     Document Type: Article

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