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Volumn 3, Issue , 2003, Pages 108-113

Fault location for teed circuits with mutually coupled lines and series capacitors

Author keywords

Electromagnetic transients simulations; Fault location; Frequency dependent line model; Modal transformation; Parallel transmission lines; Series compensation; Travelling waves; Wavelet transform

Indexed keywords

ELECTROMAGNETIC TRANSIENTS SIMULATIONS; FREQUENCY DEPENDENT LINE MODEL; MODAL TRANSFORMATION; PARALLEL TRANSMISSION LINES; SERIES COMPENSATION; TRAVELLING WAVES;

EID: 84861492284     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PTC.2003.1304370     Document Type: Conference Paper
Times cited : (20)

References (14)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.