Phase resolved near-field mode imaging for the design of frequency-selective surfaces

Optics Express

Volumn 20, Issue 11, 2012, Pages 11986-11993

  Kinzel, Edward C ^a   Ginn, James C ^b   Olmon, Robert L ^c   Shelton, David J ^b   Lail, Brian A ^d   Brener, Igal ^e   Sinclair, Michael B ^e   Raschke, Markus B ^c   Boreman, Glenn D ^a,b  

^a UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

^b Plasmonics Inc   (United States)

^c UNIVERSITY OF COLORADO   (United States)

^d Florida Institute of Technology   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

ABSORBANCES; AMPLITUDE INFORMATION; CROSSED DIPOLES; FAR-FIELD; FREQUENCY-SELECTIVE SURFACES; MODE DISTRIBUTION; NEAR-FIELD; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM);

ELECTROMAGNETIC WAVE ABSORPTION;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; MICROSCOPY; PHOTOMETRY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; MICROSCOPY; PHOTOMETRY;

EID: 84861487978     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.011986     Document Type: Article

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