Solid-state field-assisted silver diffusion in (TeO 2) 0.6(WO 3) 0.25(La 2O 3) 0.05(Na 2O) 0.1glass

Inorganic Materials

Volumn 48, Issue 6, 2012, Pages 642-647

  Stepanov, B S ^a,b   Wagner, T ^a   Lorincik, J ^c   Frumar, M ^a   Churbanov, M F ^b   Chigirinsky, Yu I ^d  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

^b INSTITUTE OF CHEMISTRY OF HIGH PURITY SUBSTANCES   (Russian Federation)

^c INSTITUTE OF PHOTONICS AND ELECTRONICS   (Czech Republic)

^d LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

DOPED LAYERS; EXPERIMENTAL DATA; PLANAR WAVEGUIDE STRUCTURES; RUTHERFORD BACKSCATTERING SPECTROMETRY; SILVER CONCENTRATION; SILVER DIFFUSION; SILVER IONS; SURFACE DENSITY; TELLURITE GLASS; THERMALLY ACTIVATED DIFFUSION;

DIFFUSION; LANTHANUM OXIDES; METAL IONS; OPTICAL GLASS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SILVER; SILVER METALLURGY; SODIUM; TELLURIUM COMPOUNDS;

GLASS;

EID: 84861450996     PISSN: 00201685     EISSN: 16083172     Source Type: Journal    
DOI: 10.1134/S0020168512060180     Document Type: Article

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