Mapping changes in helium sensitivity and peak shape for varying parameters of a Nier-type noble gas ion source

Journal of Analytical Atomic Spectrometry

Volumn 27, Issue 6, 2012, Pages 1012-1017

  Mabry, Jennifer ^a   Burnard, Peter ^a   Blard, Pierre Henri ^a   Zimmermann, Laurent ^a  

^a CRPG CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE PEAK; ELECTRON ENERGIES; EXTRACTION VOLTAGE; MAXIMUM SENSITIVITY; NOBLE GAS; PEAK SHAPES; TWO PARAMETER; VARYING PARAMETERS;

HELIUM;

ION SOURCES;

EID: 84861322890     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/c2ja10339g     Document Type: Article

References (4)

1. P. G. Burnard K. A. Farley Geochem., Geophys., Geosyst. 2000 1 7 1022
2. J. Stacey N. Sherrill G. Dalrymple M. Lanphere N. Carpenter Int. J. Mass Spectrom. Ion Phys. 1981 39 167 180
3. B. Holst J. R. Buckland W. Allison Vacuum 1999 53 207 210
4. J. S. Becker, Inorganic Mass Spectrometry: Principles and Applications, Wiley-Interscience, 2007, p. 496