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Volumn 13, Issue 1, 2013, Pages 65-77

Modelling microstructure noise with mutually exciting point processes

Author keywords

Advanced econometrics; Continuous time models; Depth and volatility; Empirical time series analysis; Market microstructure; Mathematical models; Random walks; Stochastic models

Indexed keywords


EID: 84861315065     PISSN: 14697688     EISSN: 14697696     Source Type: Journal    
DOI: 10.1080/14697688.2011.647054     Document Type: Article
Times cited : (219)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.