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Volumn , Issue , 2011, Pages 1245-1249
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On the limits of sequential testing in high dimensions
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Author keywords
[No Author keywords available]
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Indexed keywords
AVERAGE NUMBERS;
HIGH DIMENSIONS;
KULLBACK LEIBLER DIVERGENCE;
LOWER BOUNDS;
MEASUREMENT PROCEDURES;
SEQUENTIAL METHODS;
SEQUENTIAL TESTING;
SPARSE SIGNALS;
THRESHOLDING;
UNDERLYING DISTRIBUTION;
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EID: 84861313029
PISSN: 10586393
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ACSSC.2011.6190215 Document Type: Conference Paper |
Times cited : (22)
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References (8)
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