Deep Raman spectroscopy for the non-invasive standoff detection of concealed chemical threat agents

Talanta

Volumn 94, Issue , 2012, Pages 342-347

  Izake, Emad L ^a   Cletus, Biju ^a   Olds, William ^a   Sundarajoo, Shankaran ^a   Fredericks, Peter M ^a   Jaatinen, Esa ^a  

^a QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

Deep Raman; Forensic investigations; National security; Standoff detection; Threat agents

Indexed keywords

LASER EXCITATION; NATIONAL SECURITY; PACKAGING MATERIALS; PLASTIC CONTAINERS; RAMAN SPECTROSCOPY; SIGNAL TO NOISE RATIO; SPECTROMETERS;

BACKGROUND ILLUMINATION; DEEP RAMAN; FORENSIC INVESTIGATION; NANOSECOND LASER EXCITATION; SPACE RESOLVED MEASUREMENTS; SPATIALLY OFFSET RAMAN SPECTROSCOPIES; STANDOFF DETECTION; THREAT AGENTS;

CHEMICAL DETECTION;

EID: 84861229226     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2012.03.053     Document Type: Article

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