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Volumn 225, Issue , 2012, Pages 130-135
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Effects of surfactants on the structure and crystal growth behavior of Sm 2Zr 2O 7 nanocrystalline
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Author keywords
Crystal growth; HRTEM; Nanomaterials; Sm 2Zr 2O 7; Surfactant
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Indexed keywords
AVERAGE PARTICLE SIZE;
CETYLTRIMETHYLAMMONIUM BROMIDE;
CRYSTAL GROWTH BEHAVIOR;
DIFFERENTIAL SCANNING CALORIMETERS;
FIELD EMISSION SCANNING ELECTRON MICROSCOPES;
HRTEM;
HYDROTHERMAL METHODS;
NANOCRYSTALLINES;
PYROCHLORE STRUCTURES;
SODIUM DODECYLBENZENE SULFONATE;
SPHERICAL MORPHOLOGIES;
STRUCTURAL EVOLUTION;
STRUCTURE TRANSITIONS;
ACTIVATION ENERGY;
AMMONIUM COMPOUNDS;
BROMINE COMPOUNDS;
CRYSTAL GROWTH;
DIFFERENTIAL SCANNING CALORIMETRY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
NANOSTRUCTURED MATERIALS;
RAMAN SPECTROSCOPY;
SINTERING;
SODIUM;
THERMOGRAVIMETRIC ANALYSIS;
X RAY DIFFRACTION;
ZIRCONIUM;
SURFACE ACTIVE AGENTS;
CETRIMIDE;
CHEMICAL COMPOUND;
DODECYLBENZENESULFONATE SODIUM;
FLUORITE;
MACROGOL;
NANOCRYSTAL;
PYROCHLORE;
SURFACTANT;
UNCLASSIFIED DRUG;
ARTICLE;
CERAMICS;
CONTROLLED STUDY;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
DIFFERENTIAL SCANNING CALORIMETRY;
ENERGY;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
HYDROTHERMAL ANALYSIS;
MORPHOLOGY;
PARTICLE SIZE;
POWDER;
RAMAN SPECTROMETRY;
THERMAL ANALYSIS;
THERMODYNAMICS;
THERMOGRAVIMETRY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
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EID: 84861190555
PISSN: 00325910
EISSN: 1873328X
Source Type: Journal
DOI: 10.1016/j.powtec.2012.03.050 Document Type: Article |
Times cited : (20)
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References (27)
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