Imaging slit-coupled surface plasmon polaritons using conventional optical microscopy

Optics Express

Volumn 20, Issue 10, 2012, Pages 10526-10537

  Mehfuz, R ^a   Chowdhury, F A ^a   Chau, K J ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE POLARIZATION; OPTICAL DATA STORAGE; PLASMONS; SURFACE PLASMON RESONANCE;

COUPLING EFFICIENCY; DEVICE TECHNOLOGIES; ENHANCED EFFICIENCY; FOCAL REGIONS; METAL FILM; METAL SURFACES; MICROSCOPE IMAGES; MOMENTUM MATCH; MOMENTUM OF LIGHT; NAKED-EYE; NANOSCALE RANGES; NEAR FIELD OPTICAL MICROSCOPY; OBJECTIVE LENS; OPTICAL MICROSCOPES; OPTIMAL LAYER THICKNESS; PLASMONIC; PLASMONIC LENS; POLYMER LAYERS; PROPAGATION DISTANCES; SURFACE PLASMON POLARITONS; ULTRA-THIN;

OPTICAL MICROSCOPY;

NANOMATERIAL; POLYMER;

ARTICLE; CHEMISTRY; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; MATERIALS TESTING; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; OPTICS; RADIATION SCATTERING; REFRACTOMETRY; SCANNING ELECTRON MICROSCOPY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

EQUIPMENT DESIGN; LIGHT; MATERIALS TESTING; MICROSCOPY; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICS AND PHOTONICS; POLYMERS; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 84861142875     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.010526     Document Type: Article

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