Raman spectroscopy on thin film silicon on non-transparent substrates and in solar cell devices

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 000179-000181

  Fischer, M ^a   Santbergen, R ^a   Smets, A H M ^a   Zeman, M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

A-SI:H; ABSORBER LAYERS; ABSORPTION PATH; BULK PROPERTIES; CRYSTALLINE FRACTIONS; DEPOSITION METHODS; DIAGNOSTIC TOOLS; HE-NE LASERS; HYDROGENATED AMORPHOUS SILICON (A-SI:H); LIMITING CASE; MODEL TRANSMISSION; PARTIAL COHERENT; STRETCHING MODES; SUBSTRATE MATERIAL; THIN FILM OPTICS; THIN FILM SILICON; THIN SILICON FILMS; THIN-FILM INTERFERENCE; TRANSPARENT SUBSTRATE;

HELIUM NEON LASERS; LIGHT TRANSMISSION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PHOTOVOLTAIC EFFECTS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON; THIN FILMS; TRANSFER MATRIX METHOD; VAPOR DEPOSITION;

SUBSTRATES;

EID: 84861086493     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6185875     Document Type: Conference Paper

References (6)

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3. M. Aouissi et al, Phys. Rev. B, 74, 2006, pp 054302
4. P.A. Temple et al, Phys. Rev. B, 7, 1973, pp 3685
5. M. Salis et al, J. Raman Spec., 40, 2008, pp 64
6. E.V. Johnson et al, Sol. Energ. Mat. Sol. C., 93, 2009, pp 1904