Sweep time, spectral mismatch and light soaking in thin film module measurement

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Kuurne, Johannes ^a   Tolvanen, Antti ^a   Hyvarinen, Jaakko ^a  

^a Endeas Oy   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE PERFORMANCE; FLASH SIMULATORS; LIGHT SOAKING; MAXIMUM POWER; MODULE PERFORMANCE; SPECTRAL MISMATCH; THIN FILM MODULES; THIN-FILM MEASUREMENT;

CADMIUM TELLURIDE; SILICON;

THIN FILMS;

EID: 84861068165     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922583     Document Type: Conference Paper

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