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Volumn 116, Issue 3, 2012, Pages 457-459

A measure of technological distance

Author keywords

Patents; Research and development; Technological distance

Indexed keywords


EID: 84860991817     PISSN: 01651765     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.econlet.2012.04.030     Document Type: Article
Times cited : (54)

References (9)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.