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Volumn 44, Issue , 2012, Pages 78-84

The effects of thermistor linearization techniques on the T-history characterization of phase change materials

Author keywords

Heat density; Linearization technique; PCM; T history method; Temperature accuracy; Thermistor

Indexed keywords

CHARACTERIZATION METHODS; ENERGY SUSTAINABILITY; HEAT DENSITY; LINEARIZATION TECHNIQUE; MEASURING DEVICE; NON-LINEARITY; SELF-HEATING; SOLID BASE; T-HISTORY METHOD; TEMPERATURE RANGE; TEMPERATURE UNCERTAINTIES; THERMAL CHARACTERIZATION; THERMISTOR SENSORS; WHEATSTONE BRIDGES;

EID: 84860796064     PISSN: 13594311     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.applthermaleng.2012.03.032     Document Type: Article
Times cited : (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.