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Volumn 190, Issue , 2012, Pages 24-28
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Structural characterization of the CeO 2/Gd 2O 3 mixed system by synchrotron X-ray diffraction
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Author keywords
Mixed oxide; Powder X ray diffraction; Rare earth; Rietveld method
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Indexed keywords
BIPHASIC REGION;
COMPOSITIONAL RANGE;
IONIC SIZES;
MIXED OXIDE;
MIXED SYSTEMS;
NON-TRIVIAL;
POWDER SAMPLES;
POWDER X RAY DIFFRACTION;
SLOW COOLING;
STRUCTURAL CHARACTERIZATION;
STRUCTURAL DETERMINATION;
STRUCTURAL MODELS;
SYNCHROTRON X RAY DIFFRACTION;
DECOMPOSITION;
MODEL STRUCTURES;
RARE EARTHS;
REACTION KINETICS;
RIETVELD METHOD;
X RAY DIFFRACTION;
GADOLINIUM;
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EID: 84860721934
PISSN: 00224596
EISSN: 1095726X
Source Type: Journal
DOI: 10.1016/j.jssc.2012.01.056 Document Type: Article |
Times cited : (77)
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References (19)
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