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Volumn 190, Issue , 2012, Pages 24-28

Structural characterization of the CeO 2/Gd 2O 3 mixed system by synchrotron X-ray diffraction

Author keywords

Mixed oxide; Powder X ray diffraction; Rare earth; Rietveld method

Indexed keywords

BIPHASIC REGION; COMPOSITIONAL RANGE; IONIC SIZES; MIXED OXIDE; MIXED SYSTEMS; NON-TRIVIAL; POWDER SAMPLES; POWDER X RAY DIFFRACTION; SLOW COOLING; STRUCTURAL CHARACTERIZATION; STRUCTURAL DETERMINATION; STRUCTURAL MODELS; SYNCHROTRON X RAY DIFFRACTION;

EID: 84860721934     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2012.01.056     Document Type: Article
Times cited : (77)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.