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Volumn 32, Issue 10, 2012, Pages 2399-2404
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The formation of secondary phases in Bi 0.5Na 0.375K 0.125TiO 3 ceramics
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Author keywords
BNT; Dielectric properties; Electron microscopy; Inclusions; Lead free
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Indexed keywords
BNT;
LEAD-FREE;
MIXED OXIDE ROUTE;
PARAELECTRICS;
SECONDARY PHASE;
SECONDARY PHASIS;
THERMOGRAVIMETRIC MEASUREMENT;
TIO;
VOLATILE COMPONENTS;
CERAMIC MATERIALS;
DIELECTRIC PROPERTIES;
ELECTRON MICROSCOPY;
ELECTRON PROBE MICROANALYSIS;
INCLUSIONS;
SCANNING ELECTRON MICROSCOPY;
SINTERING;
THERMOGRAVIMETRIC ANALYSIS;
X RAY DIFFRACTION;
SODIUM;
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EID: 84860575830
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2012.02.031 Document Type: Article |
Times cited : (18)
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References (17)
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