Frequency and temperature effects on dielectric and electrical characteristics of α-MnO 2 nanorods

Powder Technology

Volumn 224, Issue , 2012, Pages 356-359

  Guan, Hongtao ^a   Wang, Yude ^a   Chen, Gang ^a   Zhu, Jing ^a  

^a YUNNAN UNIVERSITY   (China)

Author keywords

Dielectric properties; Electrical properties; Manganese dioxide; Nanorods

Indexed keywords

ARRHENIUS EQUATION; DIELECTRIC LOSS TANGENT; ELECTRICAL CHARACTERISTIC; ELECTRICAL RESISTIVITY; HYDROTHERMAL METHODS; MANGANESE DIOXIDE; RISING TEMPERATURES; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY (TEM);

DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; NANORODS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

MANGANESE OXIDE;

ALPHA MANGANESE DIOXIDE; MANGANESE DIOXIDE; NANOCRYSTAL; NANOROD; UNCLASSIFIED DRUG;

ARTICLE; CRYSTAL STRUCTURE; ELECTRIC ACTIVITY; ELECTRIC FIELD; ELECTRIC RESISTANCE; ELECTROMAGNETIC FIELD; FREQUENCY ANALYSIS; MORPHOLOGICAL TRAIT; NANOANALYSIS; POLARIZATION MICROSCOPY; SCANNING ELECTRON MICROSCOPY; STRUCTURE ANALYSIS; TEMPERATURE DEPENDENCE; TEMPERATURE SENSITIVITY; THERMAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84860502362     PISSN: 00325910     EISSN: 1873328X     Source Type: Journal    
DOI: 10.1016/j.powtec.2012.03.019     Document Type: Article

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