Determining the drift time of charge carriers in p-type point-contact HPGe detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 678, Issue , 2012, Pages 98-104

  Martin, R D ^a   Amman, M ^a   Chan, Y D ^a   Detwiler, J A ^a   Loach, J C ^a   Looker, Q ^a,b   Luke, P N ^a   Poon, A W P ^a   Qian, J ^a   Vetter, K ^a,b   Yaver, H ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b Etcheverry Hall MCI 730   (United States)

Author keywords

Charge trapping; Germanium detectors; Neutrinoless double beta decay

Indexed keywords

CHARGE DEPOSITION; CHARGE SENSITIVE PREAMPLIFIER; CHARGE TRAPPING EFFECT; DOUBLE BETA DECAY; DRIFT TIME; ENERGY RESOLUTIONS; GERMANIUM DETECTOR; HIGH-PURITY GERMANIUM; HPGE DETECTORS; P-TYPE;

CHARGE CARRIERS; CHARGE TRAPPING; GERMANIUM;

POINT CONTACTS;

EID: 84860459201     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2012.02.047     Document Type: Article

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