The limits of ultrahigh-resolution x-ray mapping: Estimating uncertainties in thin-film and interface structures determined by phase retrieval methods

Journal of Physics D: Applied Physics

Volumn 45, Issue 19, 2012, Pages

  Zhou, Hua ^a,e   Pindak, Ron ^a   Clarke, Roy ^b   Steinberg, David M ^c   Yacoby, Yizhak ^d  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c TEL AVIV UNIVERSITY   (Israel)

^d HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^e ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOOTSTRAP APPROACH; EPITAXIAL THIN FILMS; INTERFACE STRUCTURES; INTERFACIAL PHENOMENA; PHASE RETRIEVAL; QUANTITATIVE MEASURES; STRUCTURAL BASIS; STRUCTURAL SOLUTIONS; SURFACE X-RAY SCATTERING; X-RAY MAPPING; X-RAY PHASE;

INFORMATION RETRIEVAL; X RAYS;

UNCERTAINTY ANALYSIS;

EID: 84860338956     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/45/19/195302     Document Type: Article

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