메뉴 건너뛰기




Volumn 100, Issue 17, 2012, Pages

Thermal stability of magnetoelectric sensors

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COEFFICIENTS; EFFECT OF TEMPERATURE; MAGNETIC NOISE; MAGNETOELECTRIC SENSORS; NOISE FLOOR; NOISE MODELS; PZT; SIMULATION-BASED; TEMPERATURE RANGE; THERMALLY STABLE;

EID: 84860330850     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4705298     Document Type: Article
Times cited : (33)

References (10)
  • 1
    • 33747623307 scopus 로고    scopus 로고
    • Multiferroic and magnetoelectric materials
    • DOI 10.1038/nature05023, PII NATURE05023
    • W. Eerenstein, N. D. Mathur, and J. F. Scott, Nature 442 (7104), 759-765 (2006). 10.1038/nature05023 (Pubitemid 44261898)
    • (2006) Nature , vol.442 , Issue.7104 , pp. 759-765
    • Eerenstein, W.1    Mathur, N.D.2    Scott, J.F.3
  • 2
    • 33846006567 scopus 로고    scopus 로고
    • Multiferroics: A magnetic twist for ferroelectricity
    • DOI 10.1038/nmat1804, PII NMAT1804
    • S. W. Cheong and M. Mostovoy, Nature Mater. 6, 13-20 (2007). 10.1038/nmat1804 (Pubitemid 46043268)
    • (2007) Nature Materials , vol.6 , Issue.1 , pp. 13-20
    • Cheong, S.-W.1    Mostovoy, M.2
  • 8
    • 35648947833 scopus 로고    scopus 로고
    • Noise and scale effects on the signal-to-noise ratio in magnetoelectric laminate sensor/detection units
    • DOI 10.1063/1.2804118
    • Z. Xing, J. Li, and D. Viehland, Appl. Phys. Lett. 91 (18), 182902 (2007). 10.1063/1.2804118 (Pubitemid 350037216)
    • (2007) Applied Physics Letters , vol.91 , Issue.18 , pp. 182902
    • Xing, Z.1    Li, J.2    Viehland, D.3
  • 9
    • 84860330241 scopus 로고    scopus 로고
    • NASA/CR 208708 (1998)
    • M. W. Hooker, NASA/CR 208708 (1998).
    • Hooker, M.W.1
  • 10
    • 38849206343 scopus 로고    scopus 로고
    • Modeling and detection of quasi-static nanotesla magnetic field variations using magnetoelectric laminate sensors
    • DOI 10.1088/0957-0233/19/1/015206, PII S0957023308532784
    • Z. P. Xing, J. Y. Zhai, S. X. Dong, J. F. Li, D. Viehland, and W. G. Odendaal, Meas. Sci. Technol. 19 (1), 015206 (2008). 10.1088/0957-0233/19/1/ 015206 (Pubitemid 351189591)
    • (2008) Measurement Science and Technology , vol.19 , Issue.1 , pp. 015206
    • Xing, Z.P.1    Zhai, J.Y.2    Dong, S.X.3    Li, J.F.4    Viehland, D.5    Odendaal, W.G.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.