Dielectric response of BaTiO 3 thin film with grain size at nanometer scale

Journal of the American Ceramic Society

Volumn 95, Issue 4, 2012, Pages 1333-1338

  Tyunina, M ^a   Malic B ^b   Plekh, M ^a   Kosec, M ^b  

^a UNIVERSITY OF OULU   (Finland)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

BATIO; CHEMICAL SOLUTION DEPOSITION; CURIE CONSTANT; DIELECTRIC HYSTERESIS; DIELECTRIC PEAKS; DIELECTRIC RESPONSE; EFFECTIVE PERMITTIVITY; FERROELECTRIC BEHAVIOR; GRAIN INTERIORS; GRAIN SIZE; HIGH TEMPERATURE; INTERFACIAL LAYER; LOW-FREQUENCY DIELECTRIC RESPONSE; NANO-METER SCALE; SMALL GRAIN SIZE;

BARIUM COMPOUNDS; BOUNDARY LAYERS; FERROELECTRIC MATERIALS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PERMITTIVITY; PHASE DIAGRAMS; THIN FILMS;

FREQUENCY RESPONSE;

EID: 84859627326     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2011.04950.x     Document Type: Article

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