Adaptive optics for high-resolution microscopy: Wave front sensing using back scattered light

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8253, Issue , 2012, Pages

  Rahman, Saad A ^a   Booth, Martin J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Aberrations; Adaptive optics; Confocal microscope; Wave front sensing

Indexed keywords

ABERRATION MEASUREMENT; BACK-SCATTERED; CONFOCAL MICROSCOPES; DETRIMENTAL EFFECTS; DIRECT WAVES; DOUBLE PASS; HIGH-RESOLUTION MICROSCOPES; HIGH-RESOLUTION MICROSCOPY; LASER ILLUMINATION; LINEAR RESPONSE; MICROSCOPE SYSTEMS; OPTIMISATION METHOD; SHACK-HARTMANN WAVEFRONT SENSORS; WAVE FRONT SENSING;

ABERRATIONS; MICROSCOPES; SENSORS; WAVEFRONTS;

ADAPTIVE OPTICS;

EID: 84859585587     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.909845     Document Type: Conference Paper

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