SCOPUS 정보 검색 플랫폼

Volumn 100, Issue 12, 2012, Pages

Emission stability enhancement of a tip-type carbon-nanotube-based field emitter via hafnium interlayer deposition and thermal treatment

(4) Kim, Jong Pil a Chang, Han Beet b Kim, Bu Jong b Park, Jin Seok b

a SAMSUNG Electronics (South Korea)

b Hanyang University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVE FORCE; CARBON NANOTUBES (CNTS); ELECTROPHORETIC DEPOSITIONS; EMISSION STABILITY; FIELD EMITTER; NANO-SCRATCH; TUNGSTEN SUBSTRATE; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

ADHESION; ELECTROPHORESIS; HAFNIUM; TUNGSTEN; X RAY PHOTOELECTRON SPECTROSCOPY;

DEPOSITION;

EID: 84859531052 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3695173 Document Type: Article

Times cited : (4)

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