A robust standard deviation control chart

Technometrics

Volumn 54, Issue 1, 2012, Pages 73-82

  Schoonhoven, Marit ^a   Does, Ronald J M M ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Average run length; Mean squared error; Phase I; Phase II; Statistical process control

Indexed keywords

AVERAGE RUN LENGTHS; MEAN SQUARED ERROR; PHASE I; PHASE II; STATISTICAL PROCESS;

ALGORITHMS; FLOWCHARTING; STATISTICAL PROCESS CONTROL; STATISTICS;

ESTIMATION;

EID: 84859501387     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1080/00401706.2012.648869     Document Type: Article

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