|
Volumn 335, Issue 6077, 2012, Pages 41-42
|
Applied physics: Stressing ferroelectrics
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BARIUM DERIVATIVE;
NANOMATERIAL;
PHYSICS;
POLARIZATION;
SCANNING ELECTRON MICROSCOPY;
ASTRONOMY;
ATOMIC FORCE MICROSCOPY;
ELECTRICITY;
FERROELECTRIC;
MECHANICAL STRESS;
NANOTECHNOLOGY;
PHYSICS;
PIEZOELECTRICITY;
POLARIZATION;
PRIORITY JOURNAL;
SHORT SURVEY;
|
EID: 84859487069
PISSN: 00368075
EISSN: 10959203
Source Type: Journal
DOI: 10.1126/science.1220827 Document Type: Short Survey |
Times cited : (21)
|
References (9)
|