Unraveling the mysterious role of palladium in feigl bis (dimethylglyoximate)nickel(II) spot tests by means of confocal raman microscopy

Analytical Chemistry

Volumn 84, Issue 7, 2012, Pages 3067-3069

  Huila, Manuel F G ^a   Lukin, Nikolas ^a   Parussulo, Andre L A ^a   Oliveira, Pedro V ^a   Kyohara, Pedro K ^a   Araki, Koiti ^a   Toma, Henrique E ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL RAMAN MICROSCOPY; PROTECTING LAYER; PROTECTION EFFECT;

CHEMICAL ANALYSIS; CHEMISTRY;

NICKEL COMPOUNDS;

EID: 84859393535     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac3003352     Document Type: Article

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