A scan-based BIST technique using pair-wise compare of identical components

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1991, Pages 225-230

  Nadeau Dostie, B ^a   Wilcox, P S ^a   Agarwal, V K ^b  

^a NORTEL NETWORKS   (Canada)

^b MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

VLSI CIRCUITS;

ACTUAL SYSTEM; BOARD-LEVEL; IDENTICAL COMPONENTS; IEEE 1149.1; SCAN-BASED BIST; SYSTEM LEVELS; TEST DATA; TESTABILITY;

BUILT-IN SELF TEST;

EID: 84859273718     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISVD.1991.185121     Document Type: Conference Paper

References (10)

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