Figure-of-merit enhancement of surface plasmon resonance sensors in the spectral interrogation

Optics Letters

Volumn 37, Issue 7, 2012, Pages 1175-1177

  Shalabney, A ^a   Abdulhalim, I ^a,b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

FIGURE OF MERITS; HIGH REFRACTIVE INDEX; KRETSCHMANN-RAETHER CONFIGURATION; METALLIC LAYERS; RED SHIFT; RESONANCE WAVELENGTHS; SENSITIVITY ENHANCEMENTS; SPECTRAL SENSITIVITY; SURFACE PLASMON RESONANCE SENSOR; THIN DIELECTRIC LAYER;

REFRACTIVE INDEX; SPECTROSCOPY; SURFACE PLASMON RESONANCE;

SENSORS;

EID: 84859174187     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.37.001175     Document Type: Article

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